iotesters

Type Members

1. class Backend extends AnyRef

   

2. class ChiselFlatSpec extends FlatSpec with ChiselRunners with Matchers

   

   Spec base class for BDD-style testers.

3. class ChiselPropSpec extends PropSpec with ChiselRunners with PropertyChecks

   

   Spec base class for property-based testers.

4. trait ChiselRunners extends Assertions

   

   Common utility functions for Chisel unit tests.

5. abstract class HWIOTester extends BasicTester

   

   provide common facilities for step based testing and decoupled interface testing

6. class IOAccessor extends AnyRef

   

   named access and type information about the IO bundle of a module used for building testing harnesses

7. abstract class OrderedDecoupledHWIOTester extends HWIOTester

   

   Base class supports implementation of test circuits of modules that use Decoupled inputs and either Decoupled or Valid outputs Multiple decoupled inputs are supported.

   Base class supports implementation of test circuits of modules that use Decoupled inputs and either Decoupled or Valid outputs Multiple decoupled inputs are supported. Testers that subclass this will be strictly ordered. Input will flow into their devices asynchronously but in order they were generated be compared in the order they are generated

   Example:

   1. class XTimesXTester extends [[OrderedDecoupledHWIOTester]] {
        val device_under_test = new XTimesY
        test_block {
          for {
            i <- 0 to 10
            j <- 0 to 10
          } {
            input_event(device_under_test.io.in.x -> i, device_under_test.in.y -> j)
            output_event(device_under_test.io.out.z -> i*j)
          }
        }
      }

      an input event is a series of values that will be gated into the decoupled input interface at the same time an output event is a series of values that will be tested at the same time independent small state machines are set up for input and output interface all inputs regardless of interfaces are submitted to the device under test in the order in which they were created likewise, all outputs regardless of which interface are tested in the same order that they were created

8. class PeekPokeTester[+T <: Module] extends Tester[T]

   

9. abstract class SteppedHWIOTester extends HWIOTester

   

   Use a UnitTester to construct a test harness for a chisel module this module will be canonically referred to as the device_under_test, often simply as c in a unit test, and also dut The UnitTester is used to put series of values (as chisel.Vec's) into the ports of the dut io which are INPUT At specified times it check the dut io OUTPUT ports to see that they match a specific value The vec's are assembled through the following API poke, expect and step, pokes

   Use a UnitTester to construct a test harness for a chisel module this module will be canonically referred to as the device_under_test, often simply as c in a unit test, and also dut The UnitTester is used to put series of values (as chisel.Vec's) into the ports of the dut io which are INPUT At specified times it check the dut io OUTPUT ports to see that they match a specific value The vec's are assembled through the following API poke, expect and step, pokes

   Example:

   1. class Adder(width:Int) extends Module {
        val io = new Bundle {
          val in0 : UInt(INPUT, width=width)
          val in1 : UInt(INPUT, width=width)
          val out : UInt(OUTPUT, width=width)
        }
      }
      class AdderTester extends UnitTester {
        val device_under_test = Module( new Adder(32) )
        testBlock {
          poke(c.io.in0, 5)
          poke(c.io.in1, 7)
          expect(c.io.out, 12)
        }
      }